Aie , cela ''ne sent pas bon'' ,
pourtant ce disk à tourné que 347 heures selon les logs
smartctl 6.6 2017-11-05 r4594
[x86_64-linux-4.19.0-14-amd64] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Blue
Device Model: WDC WD40EZRZ-00WN9B0
Serial Number: WD-WCC4E7CA97YE
LU WWN Device Id: 5 0014ee 2b799be22
Firmware Version: 80.00A80
User Capacity: 4 000 787 030 016 bytes [4,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5400 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sat Mar 6 22:41:41 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status command failed: Connexion terminée par expiration du
délai d'attente
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.
General SMART Values:
Offline data collection status: (0x82) Offline data collection
activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test
routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (54240) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before
entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging
supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 542) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail
Always - 0
3 Spin_Up_Time 0x0027 175 170 021 Pre-fail
Always - 8233
4 Start_Stop_Count 0x0032 100 100 000 Old_age
Always - 227
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail
Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age
Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age
Always - 347
10 Spin_Retry_Count 0x0032 100 100 000 Old_age
Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age
Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
Always - 226
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age
Always - 105
193 Load_Cycle_Count 0x0032 199 199 000 Old_age
Always - 3937
194 Temperature_Celsius 0x0022 119 104 000 Old_age
Always - 33
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age
Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age
Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 345 hours (14 days + 9
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 53 4f c2 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d8 00 01 4f c2 a0 00 00:00:59.606 SMART ENABLE
OPERATIONS
ec 20 3f 01 00 00 a0 00 00:00:59.605 IDENTIFY DEVICE
10 20 3f 01 00 00 a0 00 00:00:59.604 RECALIBRATE [OBS-4]
91 20 3f 01 00 00 af 00 00:00:59.591 INITIALIZE DEVICE
PARAMETERS [OBS-6]
ec 00 00 01 00 00 a0 00 00:00:28.838 IDENTIFY DEVICE
Error 1 occurred at disk power-on lifetime: 345 hours (14 days + 9
hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 61 00 53 4f c2 a0 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d8 00 01 4f c2 a0 00 00:00:04.170 SMART ENABLE
OPERATIONS
ec 20 3f 01 00 00 a0 00 00:00:04.170 IDENTIFY DEVICE
10 20 3f 01 00 00 a0 00 00:00:04.164 RECALIBRATE [OBS-4]
91 20 3f 01 00 00 af 00 00:00:04.164 INITIALIZE DEVICE
PARAMETERS [OBS-6]
ec 00 00 01 00 00 a0 00 00:00:04.162 IDENTIFY DEVICE
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl
-t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of
disk.
If Selective self-test is pending on power-up, resume after 0
minute delay.